Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds?—A Survey
نویسندگان
چکیده
منابع مشابه
Pattern Run - Length for Test Data Compression
This paper presents a new pattern run-length compression method whose decompressor is simple and easy to implement. It encodes 2|n| runs of compatible or inversely compatible patterns, either inside a single test data segment or across multiple test data segments. Experimental results show that it can achieve an average compression ratio of 67.64% and considerable test application time savings.
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This paper presents a pattern run-length compression method. Compression is conducted by encoding 2 runs of compatible or inversely compatible patterns into codewords in both views either inside a single segment or across multiple segments. With the provision of high compression flexibility, this method can achieve significant compression. Experimental results for the large ISCAS’89 benchmark c...
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A power efficient System-on-a-Chip test data compressionmethod using alternating statistical run-length coding is proposed. To effectively reduce test power dissipation, the test set is firstly preprocessed by 2D reordering scheme. To further improve the compression ratio, 4 m partitioning of the runs and a smart filling of the don’t care bits provide the nice results, and alternating statistic...
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In all System-on-a-Chip (SoC) designs, there is a necessity to reduce the large test data volume and this is achieved by test data compression. One of the methods is the variable-to-variable length compression method. A selective run-length based compression which comes under variable-to-variable method is presented in this paper. The proposed work is based on threshold calculation on don’t car...
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ژورنال
عنوان ژورنال: VLSI Design
سال: 2010
ISSN: 1065-514X,1563-5171
DOI: 10.1155/2010/670476